Monday, January 5th, 2009
FSI International, Inc. (Nasdaq: FSII) announced December 23, 2008 that it has received an order for it’s new ORION® single wafer cleaning platform after a beta evaluation by a major semiconductor manufacturer. The tool will be used for resist strip in 32nm metal interconnect modules, using FSI’s proprietary “ViPR” extension of the classic “piranha” (a.k.a., […]
FSI cleaning tool exits beta with payment
Tags: 32nm, beta, clean, interconnect, Semiconductor, single-wafer, SPM, ViPR
Posted in Equipment, fab, IC, Product | Comments Off on FSI cleaning tool exits beta with payment
Sunday, January 4th, 2009
This is the first example of a posting to BetaSights new BetaBlog. New posts will appear most working days, so bookmark this site and check back regularly. BetaSights was founded in the fall of 2008 by industry veterans Ed Korczynski and Elizabeth Schumann, to provide commercial free, member supported, productive info about fab beta sites. […]
Welcome to the beginning of BetaBlog(SM)
Tags: Equipment, fab, FPD, IC, materials, MEMS, PV, Service
Posted in Equipment, fab, FPD, IC, Material, MEMS, Product, PV, Service | Comments Off on Welcome to the beginning of BetaBlog(SM)
